On-chip Electromigration Sensor for Silicon Lifecycle Management of Nanoscale VLSI
Author:
Affiliation:
1. Karlsruhe Institute of Technology (KIT)
2. Synopsys
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10173930/10173940/10173993.pdf?arnumber=10173993
Reference13 articles.
1. Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited)
2. SRAM bit-line electromigration mechanism and its prevention scheme;guan;ISQED,2013
3. Copper electromigration; prediction of scaling limits;zahedmanesh;IITC,2019
4. Electromigration and Thermal Storage Study of Barrierless Co Vias
5. Recent Progress in Physics-Based Modeling of Electromigration in Integrated Circuit Interconnects
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