Semi-Supervised Deep Learning for Microcontroller Performance Screening
Author:
Affiliation:
1. Politecnico di Torino,Turin,Italy
2. Infineon Technologies AG,Munich,Germany
3. Technical University of Munich,Munich,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10173930/10173940/10174083.pdf?arnumber=10174083
Reference35 articles.
1. Predictive subset testing: optimizing IC parametric performance testing for quality, cost, and yield
2. Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing
3. The effect of guardbands on errors in production testing
4. Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data
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1. Enabling Inter-Product Transfer Learning on MCU Performance Screening;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14
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