Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data-Reference-Cited by-同舟云学术

Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data

Published:2022-09-12 Issue: Volume: Page:
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Container-title:2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)
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Author:

Bellarmino Nicolo¹,Cantoro Riccardo¹,Huch Martin²,Kilian Tobias²,Schlichtmann Ulf³,Squillero Giovanni¹

Affiliation:

1. Politecnico di Torino,Torino,Italy

2. Infineon Technologies AG,Munich,Germany

3. Technical University of Munich,Munich,Germany

Publisher

IEEE

Link

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2. A Multilabel Active Learning Framework for Microcontroller Performance Screening;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-10

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