Radiation Damage Effects in X-ray SOI Pixel Sensors with Pinned Depleted Diode Structure
Author:
Affiliation:
1. University of Tokyo,Tokyo,Japan
2. Tokyo University of Science,Noda,Japan
3. D&S Inc,Hachioji,Japan
4. Kyoto University,Kyoto,Japan
5. University of Miyazaki,Miyazaki,Japan
6. Konan University,Kobe,Japan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10337770/10337807/10338691.pdf?arnumber=10338691
Reference5 articles.
1. Kyoto’s event-driven x-ray astronomy SOI pixel sensor for the FORCE mission;Tsuru
2. A broadband x-ray imaging spectroscopy in the 2030s: the FORCE mission
3. A Low-Noise X-ray Astronomical Silicon-On-Insulator Pixel Detector Using a Pinned Depleted Diode Structure
4. Radiation damage effects on double-SOI pixel sensors for X-ray astronomy
5. Proton radiation hardness of x-ray SOI pixel sensors with pinned depleted diode structure
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