Author:
Mori Koji,Tsuru Takeshi G.,Nakazawa Kazuhiro,Ueda Yoshihiro,Watanabe Shin,Tanaka Takaaki,Ishida Manabu,Matsumoto Hironori,Awaki Hisamitsu,Murakami Hiroshi,Nobukawa Masayoshi,Takeda Ayaki,Fukazawa Yasushi,Tsunemi Hiroshi,Takahashi Tadayuki,Hornschemeier Ann E.,Okajima Takashi,Zhang William W.,Williams Brian J.,Venters Tonia,Madsen Kristin,Yukita Mihoko,Akamatsu Hiroki,Bamba Aya,Enoto Teruaki,Fujita Yutaka,Furuzawa Akihiro,Hagino Kouichi,Ishimura Kosei,Itoh Masayuki,Kitayama Tetsu,Kobayashi Shogo B.,Kohmura Takayoshi,Kubota Aya,Mizumoto Misaki,Mizuno Tsunefumi,Nakajima Hiroshi,Nobukawa Kumiko K.,Noda Hirofumi,Odaka Hirokazu,Ota Naomi,Sato Toshiki,Shidatsu Megumi,Suzuki Hiromasa,Takahashi Hiromitsu,Tanimoto Atsushi,Terada Yukikatsu,Terashima Yuichi,Uchida Hiroyuki,Uchiyama Yasunobu,Yamaguchi Hiroya,Yatsu Yoichi
Cited by
3 articles.
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1. Radiation Damage Effects in X-ray SOI Pixel Sensors with Pinned Depleted Diode Structure;2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD);2023-11-04
2. X-raying the Universe with Semiconductor Detectors;2023 28th Microoptics Conference (MOC);2023-09-24
3. Radiation-Induced Degradation Mechanism of X-Ray SOI Pixel Sensors With Pinned Depleted Diode Structure;IEEE Transactions on Nuclear Science;2023-07