Threshold Voltage Instability Measurement Circuit for Power GaN HEMTs Devices
Author:
Affiliation:
1. International College of Semiconductor Technology, National Yang Ming Chiao Tung University, Hsinchu, Taiwan
2. Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India
Funder
Center for the Semiconductor Technology Research
Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education (MOE) in Taiwan
National Science and Technology Council (NSTC), Taiwan
Young Scholar Fellowship Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/63/10103359/10049702.pdf?arnumber=10049702
Reference15 articles.
1. Performance Degradation of GaN HEMTs Under Accelerated Power Cycling Tests
2. Characterization of Threshold Voltage Instability Under Off-State Drain Stress and Its Impact on p-GaN HEMT Performance
3. A Current-Transient Methodology for Trap Analysis for GaN High Electron Mobility Transistors
4. EPC2014 C enhancement mode power transistor,2022
5. Understanding the Threshold Voltage Instability During OFF-State Stress in p-GaN HEMTs
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Analysis of Drain-Dependent Threshold Voltage and False Turn-On of Schottky-Type p-GaN Gate HEMT in Bridge-Leg Circuit;IEEE Transactions on Power Electronics;2024-02
2. Review on Main Gate Characteristics of P-Type GaN Gate High-Electron-Mobility Transistors;Micromachines;2023-12-30
3. Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices;IEEE Transactions on Industrial Electronics;2023
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3