A Low-Noise Amplifier with Integrated Current and Power Sensors for RF BIST Applications
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/4209869/4209870/04209945.pdf?arnumber=4209945
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. Special Session – Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits;2021 IEEE 39th VLSI Test Symposium (VTS);2021-04-25
3. An Analog On-Line Gain Calibration Loop for RF Amplifiers;IEEE Transactions on Circuits and Systems I: Regular Papers;2015-08
4. Built-in Self Test of RF Subsystems with Integrated Detectors;Journal of Electronic Testing;2012-07-14
5. On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study;2011 Asian Test Symposium;2011-11
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