Built-in Self Test of RF Subsystems with Integrated Detectors-Reference-Cited by-同舟云学术

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Built-in Self Test of RF Subsystems with Integrated Detectors

Published:2012-07-14 Issue:5 Volume:28 Page:557-569
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Zhang Chaoming,Gharpurey Ranjit,Abraham Jacob A.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-012-5315-2.pdf

Reference25 articles.

1. Agilent Technologies (2006) Agilent ESA-E Series and PSA Series Spectrum Analyzer Noise Figure Measurement Personality Guide Option 219

2. Bhattacharya S, Chatterjee A (2004) A built-in loopback test methodology for RF transceiver circuits using embedded sensor circuits. In: Proc. 13th Asian test symposium, pp 68–73

3. Bhattacharya S, Halder A, Srinivasan G, Chatterjee A (2005) Alternate testing of RF transceivers using optimized test stimulus for accurate prediction of systems specifications. J Electron Test: Theory and Applications 21(3):323–339

4. Bhattacharya S, Senguttuvan R, Chatterjee A (2005) Production test method for evaluating the effect of narrow-band interference on data errors in ultra-wide band (UWB) receivers. In: IEEE MTT-S international microwave symposium digest, p 4

5. Cherubal S, Voorakaranam R, Chatterjee A, Mclaughlin J, Smith JL, Majernik DM (2004) Concurrent RF test using optimized modulated RF stimuli. In: Proc. 17th international VLSI design conference, pp 1017–1022

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analog and Mixed-Signal Test;Electronic Design Automation for IC System Design, Verification, and Testing;2016-04-14

2. Parametric Built-In Test for 65nm RF LNA Using Non-Intrusive Variation-Aware Sensors;Journal of Electronic Testing;2015-08

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