Author:
Chih-Chang Lin ,Marek-Sadowska M.,Lee M.T.-C.,Kuang-Chien Chen
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
4 articles.
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1. A New Design-for-Testability Method Based on Thru-Testability;Journal of Electronic Testing;2011-09-01
2. F-Scan: A DFT Method for Functional Scan at RTL;IEICE Transactions on Information and Systems;2011
3. Synthesis of scan chains for netlist descriptions at RT-Level;Journal of Electronic Testing;2002
4. On RTL scan design;Proceedings International Test Conference 2001 (Cat. No.01CH37260)