Electrical and Thermal Behavior of Tellurium Poor GeSbTe Compounds for Phase Change Memory

Author:

Boniardi Mattia,Redaelli Andrea,Tortorelli Innocenzo,Lavizzari Simone,Pirovano Agostino,Pellizzer Fabio,Varesi Enrico,Erbetta Davide,Bresolin Camillo,Modelli Alberto,Bez Roberto

Publisher

IEEE

Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. One-Pulse-Programmable Multi-Level PCM/Selector Cross-Point Memory for 20 nm Half Pitch and Beyond;ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC);2023-09-11

2. Modeling and Analysis of Virgin Ge-Rich GST Embedded Phase Change Memories;IEEE Transactions on Electron Devices;2023-03

3. Enhanced Thermal Confinement in Phase-Change Memory Targeting Current Reduction;ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC);2022-09-19

4. Electrical and structural properties of binary Ga–Sb phase change memory alloys;Journal of Applied Physics;2022-07-21

5. Crystallization behavior and electrical characteristics of Ga–Sb thin films for phase change memory;Nanotechnology;2020-03-10

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