Author:
Amrbar Mehran,Guertin Steven M.
Cited by
3 articles.
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1. Technology Dependence of Stuck Bits and Single-Event Upsets in 110-, 72-, and 63-nm SDRAMs;IEEE Transactions on Nuclear Science;2023-08
2. DDR3 SDRAM Stuck/Weak Bit Studies and Mitigation;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
3. Multi chips heavy ions SEE testing of the COTS Myriad-2 vision processing unit;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09