Test Methodology & Neutron Characterization of Xilinx 16nm Zynq® UltraScale+™ Multi-Processor System-on-Chip (MPSoC)
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8581398/8584255/08584299.pdf?arnumber=8584299
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation;IEEE Transactions on Reliability;2023
2. Heavy-ion and proton characterization of AMD 7nm Versal™ multicore scalar processing system (PS);2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
3. Analysis of the impact on soft error in AXI CDMA based on Xilinx Zynq-7000 FPGA;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2022-08
4. Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL);2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC);2021-07
5. Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis;Microelectronics Reliability;2021-05
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