Subject
Instrumentation,Nuclear and High Energy Physics
Reference20 articles.
1. SEFI protection for nanosat 16-bit chip onboard computer memories;Sánchez-Macián;IEEE Trans. Device Mater. Reliab.,2017
2. TCAD simulation research on the influence of particle incidence conditions on single event charge sharing effect of 28 nm SRAM;Jin;Electroni. Packag.,2019
3. GEANT4 simulation of nuclear interaction induced soft errors in digital nanoscale electronics: Interrelation between proton and heavy ion impacts;Galimov;Nucl. Instrum. Methods Phys. Res. A,2019
4. P. Maillard, M. Hart, J. Barton, et al., Neutron, 64 MeV Proton & Alpha Single-Event Characterization of Xilinx 16 Nm FinFET Zynq® UltraScale+™ MPSoC, in: IEEE Radiation Effects Data Workshop, REDW, New Orleans, la, USA, 17-21 July, 2017, pp. 1–5.
5. P. Maillard, Michael J. Hart, Single-Event Evaluation of Xilinx 16 nm UltraScale+™ Single Event Mitigation IP, in: IEEE Radiation Effects Data Workshop, REDW, Waikoloa, HI, USA, 16-20 July, 2018, pp. 1–5.
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