Texture and surface analysis of NiO buffer deposited on biaxially textured Ni tapes by a MOCVD method-Reference-Cited by-同舟云学术

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Texture and surface analysis of NiO buffer deposited on biaxially textured Ni tapes by a MOCVD method

Published:2003-06 Issue:2 Volume:13 Page:2539-2542
ISSN:1051-8223
Container-title:IEEE Transactions on Appiled Superconductivity
language:en
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Jong-Won Sun ,Hyung Seop Kim ,Bong Ki Ji ,Hai-Woong Park ,Gye-Won Hong ,Choong-Hwan Jung ,Soon-Dong Park ,Byung-Hyuk Jun ,Chan-Joong Kim

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/77/27269/01212133.pdf?arnumber=1212133

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structural and optical characteristics of NiO films deposited using the PLD technique;Materials Science and Technology;2023-07-05

2. Influence of Lattice Mismatch in Preparation of the SmBiO3 Buffer Layer by a CSD Method;IEEE Transactions on Applied Superconductivity;2017-01

3. Biepitaxial Growth of High-Quality Semiconducting NiO Thin Films on (0001) Al2O3 Substrates: Microstructural Characterization and Electrical Properties;Crystal Growth & Design;2012-04-13

4. NiO Thin Films Synthesized by Atomic Layer Deposition using Ni(dmamb)2 and Ozone as Precursors;Chemical Vapor Deposition;2012-03

5. YBa2Cu3O7−x Coated Conductors;High Temperature Superconductors;2010-10-13

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