NCFET: Opportunities & challenges for advanced technology nodes
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8232886/8246152/08246180.pdf?arnumber=8246180
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications;Science China Information Sciences;2023-09-13
2. Steep-Slope and Hysteresis-Free MoS2 Negative-Capacitance Transistors Using Single HfZrAlO Layer as Gate Dielectric;Nanomaterials;2022-12-07
3. Understanding of carriers’ kinetic energy in steep-slope P+N+P+N+ feedback field effect transistor;Semiconductor Science and Technology;2022-09-07
4. Impacts of HfZrO thickness and anneal temperature on performance of MoS2 negative-capacitance field-effect transistors;Nanotechnology;2021-08-13
5. Ferroelectric negative capacitance;Nature Reviews Materials;2019-03-14
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