Modeling and Characterization of VBUS Power Discharge for Embedded Superspeed USB Host/Devices-Reference-Cited by-同舟云学术

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Modeling and Characterization of VBUS Power Discharge for Embedded Superspeed USB Host/Devices

Published:2019-01 Issue: Volume: Page:
ISSN:
Container-title:2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)
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Author:

Pandey Maneesh,Goyal Mohit,Sharma Parul,Sharma Rohit

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8698529/8710751/08711363.pdf?arnumber=8711363

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2. Lattice disorders of TiO2 and their significance in the photocatalytic conversion of CO2;Advances in Catalysis;2020

3. Quality & Reliability Assessment of USB-PLL Clock Failure in Silicon Products;2019 IEEE 21st Electronics Packaging Technology Conference (EPTC);2019-12

4. Characterization of the cellulase-secretome produced by the Antarctic bacterium Flavobacterium sp. AUG42;Microbiological Research;2019-06

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