On Oxygen Deficiency and Fast Transient Charge-Trapping Effects in High-$k$ Dielectrics-Reference-Cited by-同舟云学术

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On Oxygen Deficiency and Fast Transient Charge-Trapping Effects in High-$k$ Dielectrics

Published:2006-12 Issue:12 Volume:27 Page:984-987
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Wen Huang-Chun,Rusty Harris H.,Young Chadwin D.,Luan Hongfa,Alshareef Husam N.,Choi Kisik,Kwong Dim-Lee,Majhi Prashant,Bersuker Gennadi,Lee Byoung Hun

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/4016178/04016206.pdf?arnumber=4016206

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