A Cryogenic On-Chip Noise Measurement Procedure With ±1.4-K Measurement Uncertainty
Author:
Affiliation:
1. Fraunhofer IAF, Fraunhofer Institute for Applied Solid State Physics,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9865233/9865240/09865294.pdf?arnumber=9865294
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