Toggle-Based Masking Scheme for Clustered Unknown Response Bits
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/5955410/5957904/05957931.pdf?arnumber=5957931
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Mitigating Observability Loss of Toggle-Based X-Masking via Scan Chain Partitioning;IEEE Transactions on Computers;2018-08-01
3. Test cost reduction for X -value elimination by scan slice correlation analysis;Proceedings of the 55th Annual Design Automation Conference;2018-06-24
4. Reducing control bit overhead for X-masking/X-canceling hybrid architecture via pattern partitioning;Proceedings of the 53rd Annual Design Automation Conference;2016-06-05
5. Unknown Output Values of Faulty Circuits and Output Response Compaction;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2014-02
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