Reducing control bit overhead for X-masking/X-canceling hybrid architecture via pattern partitioning
Author:
Affiliation:
1. Sungkyunkwan University, Suwon, Korea
2. University of Texas at Austin, TX
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/2897937.2898078
Reference18 articles.
1. X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors
2. X-masking during logic BIST and its impact on defect coverage
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. X-Masking for Deterministic In-System Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Test cost reduction for X -value elimination by scan slice correlation analysis;Proceedings of the 55th Annual Design Automation Conference;2018-06-24
3. Handling Unknown with Blend of Scan and Scan Compression;Journal of Electronic Testing;2018-03-21
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