SEU-X: A SEu un-excitability prover for SRAM-FPGAs
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/6304844/6313830/06313836.pdf?arnumber=6313836
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Fault Localization and Testability Approaches for FPGA Fabric Aware Canonic Signed Digit Recoding Implementations;Journal of Electronic Testing;2019-11-13
2. Application of Model Checking to Fault Tolerance Analysis;From Software Engineering to Formal Methods and Tools, and Back;2019
3. UA2TPG: An untestability analyzer and test pattern generator for SEUs in the configuration memory of SRAM-based FPGAs;Integration;2016-09
4. An Examination of Greek College Students’ Perceptions of Positive and Negative Effects of Social Networking Use;Lecture Notes in Social Networks;2015-10-04
5. SRAM-Based FPGA Systems for Safety-Critical Applications: A Survey on Design Standards and Proposed Methodologies;Journal of Computer Science and Technology;2015-03
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