Formal Analysis of Quasi Delay Insensitive Circuits Behavior in the Presence of SEUs-Reference-Cited by-同舟云学术

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Formal Analysis of Quasi Delay Insensitive Circuits Behavior in the Presence of SEUs

Published:2007-07 Issue: Volume: Page:
ISSN:
Container-title:13th IEEE International On-Line Testing Symposium (IOLTS 2007)
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Author:

Monnet Y.,Renaudin M.,Leveugle R.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4274802/4274803/04274829.pdf?arnumber=4274829

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the Susceptibility of QDI Circuits to Transient Faults;Lecture Notes in Computer Science;2023

2. Analysis of State Corruption caused by Permanent Faults in WCHB-based Quasi Delay-Insensitive Pipelines;2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2021-04-07

3. Identification and Confinement of Fault Sensitivity Windows in QDI Logic;2020 Austrochip Workshop on Microelectronics (Austrochip);2020-10-07

4. An infrastructure for accurate characterization of single-event transients in digital circuits;Microprocessors and Microsystems;2013-11

5. Adding Temporal Redundancy to Delay Insensitive Codes to Mitigate Single Event Effects;2012 IEEE 18th International Symposium on Asynchronous Circuits and Systems;2012-05

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