True 7nm Platform Technology featuring Smallest FinFET and Smallest SRAM cell by EUV, Special Constructs and 3rd Generation Single Diffusion Break

Author:

Jeong W.C.,Kwon D.J.,Nam K.J.,Rim W.J.,Jang M.S.,Kim H.T.,Lee Y.W.,Park J.S.,Lee E.C.,Ha D.W.,Park C.H.,Maeda S.,Cho H.-J.,Jung S.-M.,Kang H.K.,Lee H.J.,Lee K.W.,Lee T.J.,Park D.W.,Kim B.S.,Do J.H.,Fukai T.

Publisher

IEEE

Cited by 38 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. CLAY: CXL-based Scalable NDP Architecture Accelerating Embedding Layers;Proceedings of the 38th ACM International Conference on Supercomputing;2024-05-30

2. AttAcc! Unleashing the Power of PIM for Batched Transformer-based Generative Model Inference;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27

3. Standard Cell Structure and Transistor Reordering for Mitigating Area Penalty in Double Diffusion Break FinFET Process;2024 International VLSI Symposium on Technology, Systems and Applications (VLSI TSA);2024-04-22

4. Device Design and Reliability of GAA MBCFET;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

5. Redefining Innovation: A Journey forward in New Dimension Era;2023 International Electron Devices Meeting (IEDM);2023-12-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3