Design of Multiple Modulated Frequency Lock-In Amplifier for Tapping-Mode Atomic Force Microscopy Systems-Reference-Cited by-同舟云学术

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Design of Multiple Modulated Frequency Lock-In Amplifier for Tapping-Mode Atomic Force Microscopy Systems

Published:2016-10 Issue:10 Volume:65 Page:2284-2292
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Ayat Mehdi^ORCID,Karami Mohammad Amin,Mirzakuchaki Sattar,Beheshti-Shirazi Aliasghar

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/7564374/07505629.pdf?arnumber=7505629

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Reliable Methodology to FPGA Design Verification and Noise Analysis for Digital Lock-In Amplifiers;IEEE Embedded Systems Letters;2024-09

2. Enhanced two consecutive samples based de-modulation technique for atomic force microscopy application;Measurement;2023-12

3. High-Performance Digital Lock-In Amplifier Module Based on an Open-Source Red Pitaya Platform: Implementation and Applications;IEEE Transactions on Instrumentation and Measurement;2023

4. Optimizing FDLIA to realize high-speed and high-precision detection of multi-channel signals;Digital Signal Processing;2022-11

5. A Software-Based Lock-in Amplifier for Optical Spectroscopy Applications;2022 SBFoton International Optics and Photonics Conference (SBFoton IOPC);2022-10-13

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