RRAM based random bit generation for hardware security applications
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/7827413/7845255/07845382.pdf?arnumber=7845382
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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3. Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories;Journal of Applied Physics;2021-08-07
4. Physical Unclonable Functions Using Ferroelectric Tunnel Junctions;IEEE Electron Device Letters;2021-06
5. Neural network based analysis of random telegraph noise in resistive random access memories;Semiconductor Science and Technology;2020-01-17
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