1. Run Time Memory Error Recovery Process in Networking System;2023 7th International Conference on System Reliability and Safety (ICSRS);2023-11-22
2. Smart Devices and SRAM: Analyzing Their Impact;2023 International Conference on Sustainable Emerging Innovations in Engineering and Technology (ICSEIET);2023-09-14
3. Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning;IEEE Transactions on Device and Materials Reliability;2023-09
4. Restructuring-Based Lifetime Reliability Improvement of Nanoscale Master-Slave Flip-Flops;Lifetime Reliability-aware Design of Integrated Circuits;2022-11-17
5. Retention Problem Free High Density 4T SRAM cell with Adaptive Body Bias in 18nm FD-SOI;2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID);2022-02