Vacuum breakdown strength of vacuum-degassed oxygen-free copper electrodes-Reference-Cited by-同舟云学术

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Vacuum breakdown strength of vacuum-degassed oxygen-free copper electrodes

Published:1993 Issue:4 Volume:28 Page:500-506
ISSN:0018-9367
Container-title:IEEE Transactions on Electrical Insulation
language:
Short-container-title:IEEE Trans. Elect. Insul.

Author:

Kobayashi S.,Saito Y.,Nagai Y.,Yamamoto Y.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,General Engineering

Link

http://xplorestaging.ieee.org/ielx1/14/5986/00231532.pdf?arnumber=231532

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. Relation between breakdown voltage and prebreakdown current in vacuum gap;Electrical Engineering in Japan;2000-06

4. Recent experiments on vacuum breakdown of oxygen-free copper electrodes;IEEE Transactions on Dielectrics and Electrical Insulation;1997

5. Optimization of the configuration of the vacuum pumps in the KEK 2.5‐GeV linac;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1994-07

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