Automated manipulation of flexible nanowires with an atomic force microscope
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8270700/8286251/08286320.pdf?arnumber=8286320
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. MAM-STM: A software for autonomous control of single moieties towards specific surface positions;Computer Physics Communications;2024-10
2. Electrical characterization of an individual nanowire using flexible nanoprobes fabricated by atomic force microscopy-based manipulation;Nanotechnology and Precision Engineering;2023-10-12
3. Non-Linear Non-Classical Modeling of Microparticles Manipulation Based on Finite Element Method;International Journal of Applied Mechanics;2023-10-05
4. A Combination System of a Thin Atomic Force Microscope and an Upright Raman Microscope for Position-Controllable Surface-Enhanced Raman Scattering;Microscopy and Microanalysis;2023-01-11
5. Deep-learning-based nanowire detection in AFM images for automated nanomanipulation;Nanotechnology and Precision Engineering;2021-03-01
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