Deep-learning-based nanowire detection in AFM images for automated nanomanipulation
Author:
Affiliation:
1. State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
Publisher
AIP Publishing
Subject
Automotive Engineering
Link
https://aip.scitation.org/doi/pdf/10.1063/10.0003218
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