DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

DRAM-Based Error Detection Method to Reduce the Post-Silicon Debug Time for Multiple Identical Cores

Published:2017-09-01 Issue:9 Volume:66 Page:1504-1517
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Oh Hyunggoy,Choi Inhyuk,Kang Sungho

Funder

National Research Foundation of Korea (NRF)

Korean government (MSIP)

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

http://xplorestaging.ieee.org/ielx7/12/8003558/07872459.pdf?arnumber=7872459

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On-Chip Error Detection Reusing Built-In Self-Repair for Silicon Debug;IEEE Access;2021

2. A Methodology to Capture Fine-Grained Internal Visibility During Multisession Silicon Debug;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2020-04

3. Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost;IEEE Transactions on Computers;2018-12-01

4. A debug scheme to improve the error identification in post-silicon validation;PLOS ONE;2018-09-04

5. Debug Data Reduction Techniques;Post-Silicon Validation and Debug;2018-09-02

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP