Experimental Study of the Effect of Temperature Dependent Charging on the Evolution of the Eey of SiO<sub>2</sub> Thin Films-Reference-Cited by-同舟云学术

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Experimental Study of the Effect of Temperature Dependent Charging on the Evolution of the Eey of SiO₂ Thin Films

Published:2022-05-22 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Conference on Plasma Science (ICOPS)
language:
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Author:

Gibaru Q.¹,Belhaj M.¹,Inguimbert C.¹,Dadouch S.¹,Raine M.²,Lambert D.²

Affiliation:

1. Toulouse,ONERA, DPHY,France

2. Arpajon,CEA DAM,France

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9812948/9812949/09813278.pdf?arnumber=9813278

Reference5 articles.

1. Experimental investigation of the effect of the internal space charge accumulation on the electron emission yield of insulators submitted to e-irradiation: application to polycrystalline MgO

2. e-Induced secondary electron emission yield of insulators and charging effects

3. Electron Emission Properties of Space Used Dielectric Materials;belhaj;Spacecraft Charging Tech Conf,2014

4. Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature condition

5. Multipactor and corona discharge: Theoretical fundamentals and analysis with CST and SPARK3D software tools

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