Electron emission yield and charging process of alkali-silicate glass submitted to an electron beam under the varying temperature condition
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference28 articles.
1. Material Charging in Space Environment: Experimental Test Simulation and Induced Conductive Mechanisms
2. Electron Probe Microanalysis of Insulating Oxides: Monte Carlo Simulations
3. Minimizing Errors in Electron Microprobe Analysis
4. Analysis for charged spacers in FED
5. Study of electrical properties of silica glasses, intended for FED spacers, under electron irradiation
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Secondary electron emission yield in thick dielectric materials: a comparison between Kelvin probe and capacitive methods;Journal of Physics D: Applied Physics;2024-07-12
2. Temperature effects on electric charge transport processes and electron emission in PBS–clay nanocomposites submitted to electron bombardment;Journal of Physics D: Applied Physics;2023-07-07
3. Experimental and Monte-Carlo study of double-hump electron emission yield curves of SiO2 thin films;Journal of Applied Physics;2023-04-04
4. Experimental Study of the Effect of Temperature Dependent Charging on the Evolution of the Eey of SiO2 Thin Films;2022 IEEE International Conference on Plasma Science (ICOPS);2022-05-22
5. Energy spectra of secondary electrons in dielectric materials by charging analysis;Results in Physics;2020-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3