Non-Iterative Method for Extracting Complex Permittivity and Thickness of Materials From Reflection-Only Measurements
Author:
Affiliation:
1. State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing, China
2. Xinchen Technologies Company Ltd., Beijing, China
Funder
National Natural Science Foundation of China
Hebei Provincial Key Research Projects
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/9717300/09766023.pdf?arnumber=9766023
Reference25 articles.
1. Noniterative Permittivity Extraction of Lossy Liquid Materials From Reflection Asymmetric Amplitude-Only Microwave Measurements
2. Automatic measurement of complex dielectric constant and permeability at microwave frequencies
3. Direct Extraction of Complex Permittivity and Permeability of Materials on a Known-Substrate From Transmission/Reflection Measurements
4. A Free-Space Measurement Method for the Low-Loss Dielectric Characterization Without Prior Need for Sample Thickness Data
5. Free-Space Time Domain Position Insensitive Technique for Simultaneous Measurement of Complex Permittivity and Thickness of Lossy Dielectric Samples
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