Author:
Chun-Chin Tsai ,Yi-Cheng Hsu ,Sheng-Bang Huang ,Ying-Jyun Lin ,Wang J.,Ming-Hung Chen ,Chao-Wei Lee ,Hung-Lieh Hu ,Wood-Hi Cheng
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
48 articles.
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