Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
37 articles.
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1. Hot Carrier Effects on High Frequency Characteristics of SiGe HBTs;International Journal of Electronics Letters;2023-10-09
2. RF Reliability of SiGe and InP HBTs: A Comparative Study;2023 IEEE/MTT-S International Microwave Symposium - IMS 2023;2023-06-11
3. Long-Term Large-Signal RF Reliability Characterization of SiGe HBTs Using a Passive Impedance Tuner System;2022 IEEE/MTT-S International Microwave Symposium - IMS 2022;2022-06-19
4. Electro-Thermal Limitations and Device Degradation of SiGe HBTs with Emphasis on Circuit Performance;2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2021-12-05
5. An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs;2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS);2021-12-05