Author:
Marc F.,Mongellaz B.,Bestory C.,Levi H.,Danto Y.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
11 articles.
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1. Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization;ACM Transactions on Design Automation of Electronic Systems;2024-08-13
2. Analysis of a failure mechanism occurring in SiGe HBTs under mixed-mode stress conditions;2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS);2019-03
3. A Fast Aging Simulation Based On Delta Model For Analog Circuit Modification and Verification;Proceedings of the 2019 2nd International Conference on Electronics, Communications and Control Engineering - ICECC 2019;2019
4. Reliability-Aware Circuit Design Methodology for Beyond-5G Communication Systems;IEEE Transactions on Device and Materials Reliability;2017-09
5. An Incremental Simulation Technique Based on Delta Model for Lifetime Yield Analysis;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2017