Wages: The Worst Transistor Aging Analysis for Large-scale Analog Integrated Circuits via Domain Generalization

Abstract

Transistor aging leads to the deterioration of analog circuit performance over time. The worst aging degradation is used to evaluate the circuit reliability. It is extremely expensive to obtain it since several circuit stimuli need to be simulated. The worst degradation collection cost reduction brings an inaccurate training dataset when a machine learning (ML) model is used to fast perform the estimation. Motivated by the fact that there are many similar subcircuits in large-scale analog circuits, in this article we propose Wages to train an ML model on an inaccurate dataset for the worst aging degradation estimation via a domain generalization technique. A sampling-based method on the feature space of the transistor and its neighborhood subcircuit is developed to replace inaccurate labels. A consistent estimation for the worst degradation is enforced to update model parameters. Label updating and model updating are performed alternately to train an ML model on the inaccurate dataset. Experimental results on the very advanced 5 nm technology node show that our Wages can significantly reduce the label collection cost with a negligible estimation error for the worst aging degradations compared to the traditional methods.