Comparison of Impedance Matching Networks for Scanning Microwave Microscopy-Reference-Cited by-同舟云学术

Comparison of Impedance Matching Networks for Scanning Microwave Microscopy

Published:2024 Issue: Volume:73 Page:1-9
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Hoffmann Johannes¹^ORCID,de Préville Sophie¹^ORCID,Eckmann Bruno¹^ORCID,Lin Hung-Ju¹^ORCID,Herzog Benedikt²^ORCID,Haddadi Kamel³^ORCID,Théron Didier³^ORCID,Gramse Georg⁴^ORCID,Richert Damien⁵^ORCID,Morán-Meza José⁵^ORCID,Piquemal François⁵^ORCID

Affiliation:

1. RF and Microwave Laboratory, Federal Institute of Metrology METAS, Bern-Wabern, Switzerland

2. Gymnasium Oberwil, Oberwil, Switzerland

3. Univ. Lille, CNRS, Univ. Polytechnique Hautsde-France, UMR 8520–IEMN, Lille, France

4. Biophysics Institute, Johannes Kepler University, Linz, Austria

5. Laboratoire national de métrologie et d’essais (LNE), Trappes, France

Funder

EMPIR program

European Union’s Horizon 2020 Research and Innovation Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/19/10367905/10477242.pdf?arnumber=10477242

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3. A novel method for direct impedance measurement in microwave and mm-wave bands

4. Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients

5. Interferometric Technique for Scanning Near-Field Microwave Microscopy Applications