Uncertainties Caused by Noise for Microwave Interferometric and Reflection Measurements of Extreme Reflection Coefficients
Author:
Affiliation:
1. Department of Electromagnetic Field, Faculty of Electrical Engineering, Czech Technical University in Prague, Prague, Czech Republic
Funder
European Metrology Research Program (EMRP) Project SIB62 Metrology for New Electrical Measurement Quantities in High-Frequency Circuits
EMRP participating countries within EURAMET and the European Union
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/19/10012124/10049186.pdf?arnumber=10049186
Reference25 articles.
1. A Method for Direct Impedance Measurement in Microwave and Millimeter-Wave Bands
2. A simple method for extreme impedances measurement - experimental testing
3. Contemporary evaluation of measurement uncertainties in vector network analysis
4. Propagating S-parameter uncertainties to other measurement quantities
5. Evaluation and modeling of measurement resolution of a vector network analyzer for extreme impedance measurements
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