Author:
Bhattacharyya G.K.,Fries A.,Johnson R.A.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
12 articles.
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1. Software Test-Run Reliability Modeling with Non-homogeneous Binomial Processes;2018 IEEE 23rd Pacific Rim International Symposium on Dependable Computing (PRDC);2018-12
2. Reliability Growth Modeling;Wiley StatsRef: Statistics Reference Online;2014-09-29
3. Reliability Growth Modeling;Encyclopedia of Statistics in Quality and Reliability;2008-03-15
4. PROBABILITY MODELS FOR SEQUENTIAL-STAGE SYSTEM RELIABILITY GROWTH VIA FAILURE MODE REMOVAL;International Journal of Reliability, Quality and Safety Engineering;2003-03
5. A discretizing approach for evaluating reliability of complex systems under stress-strength model;IEEE Transactions on Reliability;2001-06