PROBABILITY MODELS FOR SEQUENTIAL-STAGE SYSTEM RELIABILITY GROWTH VIA FAILURE MODE REMOVAL

Author:

GAVER DONALD P.1,JACOBS PATRICIA A.1,GLAZEBROOK KEVIN D.2,SEGLIE ERNEST A.3

Affiliation:

1. Operations Research Department, Naval Postgraduate School, Monterey, California, USA

2. Department of Business Studies, University of Edinburgh, Edinburgh EH8 9JY, United Kingdom

3. The Pentagon Washington, DC, USA

Abstract

This paper provides guidance for the planners of a test of any system that operates in sequential stages: only if the first stage functions properly (e.g., a vehicle's starter motor rotates adequately) can the second stage be activated (ignition system performs) and hence tested, followed by a third stage (engine starts and propels vehicle), with further stages such as wheels, and steering, and finally brakes eventually brought to test. Each sequential stage may fail to operate because its design, manufacture, or usage has faults or defects that may give rise to failure. Testing of all stages in the entire system in appropriate environments allows failures at the various stages to reveal defects, which are targets for removal. Early stages' fault activations thus postpone exposure of later stages to test. It is clear that only by allowing the entire system to be tested end-to-end, through all stages, and to observe several total system successes can one be assured that the integrated system is relatively free of defects and is likely to perform well if fielded. The methodology of the paper permits a test planner to hypothesize the numbers of (design) faults present in each stage, and the stagewise probability of a fault activation, leading to a system failure at that stage, given survival to that stage. If the test item fails at some stage, then rectification ("fix") of the design occurs, and the fault is (likely) removed. Failure at that stage is hence less likely on future tests, allowing later stages to be activated, tested, and fixed. So reliability grows. To allow many Test and Fix (TAF) cycles is obviously impractical. A stopping criterion proposed by E. A. Seglie that suggests test stopping as soon as an uninterrupted run/sequence of r (e.g., 5) consecutive system successes has been achieved is studied quantitatively here. It is shown how to calculate the probability of eventual field success if the design is frozen and the system fielded after such a sequential stopping criterion is achieved. The mean test length is also calculated. Many other calculations are possible, based on formulas presented.

Publisher

World Scientific Pub Co Pte Lt

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Energy Engineering and Power Technology,Aerospace Engineering,Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering,General Computer Science

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Operating with an incomplete checklist;IISE Transactions;2018-01-15

2. Reliability growth by failure mode removal;Reliability Engineering & System Safety;2014-10

3. System Availability;Wiley StatsRef: Statistics Reference Online;2014-09-29

4. Automated Statistical Testing for Embedded Systems;Model-Based Testing for Embedded Systems;2011-09-15

5. System Availability;Wiley Encyclopedia of Operations Research and Management Science;2011-02-15

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3