C-MOS/SOS LSI input/Output protection networks-Reference-Cited by-同舟云学术

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C-MOS/SOS LSI input/Output protection networks

Published:1978-08 Issue:8 Volume:25 Page:933-938
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Ahlport B.T.,Cricchi J.R.,Barth D.A.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/31779/01479598.pdf?arnumber=1479598

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. CMOS-on-SOI ESD protection networks;Journal of Electrostatics;1998-01

2. The Effects of Electrostatic Discharge on Microelectronic Devices A Review;IEEE Transactions on Industry Applications;1984-03

3. Input protection of low-current DC amplifiers by GaAsP diodes;Journal of Physics E: Scientific Instruments;1981-04

4. Improvement in gate breakdown voltage for SOS devices;IEEE Transactions on Electron Devices;1981-03

5. CMOS integrated circuit reliability;Microelectronics Reliability;1981-01

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