Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
9 articles.
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1. Charge-coupled devices as particle tracking detectors;Review of Scientific Instruments;1998-04
2. Nonideal behaviour of buried channel CCDs caused by oxide and bulk silicon traps;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1991-08
3. Future potential of charge coupled devices as detectors of ionising radiation;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1991-08
4. A model for charge transfer in buried-channel charge-coupled devices at low temperature;IEEE Transactions on Electron Devices;1991-05
5. Improvement of dark signal and near IR response of imaging CCD under vacuum surface operation;Solid-State Electronics;1989-11