Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
8 articles.
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1. Temperature characterization of deep and shallow defect centers of low noise silicon JFETs;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2004-01
2. Low-frequency noise in proton damaged LDD MOSFET's;IEEE Transactions on Electron Devices;1999-07
3. Effects of Radiation Damage on Scientific Charge Coupled Devices;Advances in Imaging and Electron Physics;1999
4. Low noise JFETs for room temperature x-ray detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1996-10
5. Noise analysis of low noise, high count rate, PIN diode X-ray detectors;IEEE Transactions on Nuclear Science;1996-06