Characterization of thin-oxide MNOS memory transistors-Reference-Cited by-同舟云学术

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Characterization of thin-oxide MNOS memory transistors

Published:1972-12 Issue:12 Volume:19 Page:1280-1288
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

White M.H.,Cricchi J.R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/31705/01477062.pdf?arnumber=1477062

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