Tolerance of Siamese Networks (SNs) to Memory Errors: Analysis and Design-Reference-Cited by-同舟云学术

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Tolerance of Siamese Networks (SNs) to Memory Errors: Analysis and Design

Published:2023-04-01 Issue:4 Volume:72 Page:1136-1149
ISSN:0018-9340
Container-title:IEEE Transactions on Computers
language:
Short-container-title:IEEE Trans. Comput.

Author:

Wang Ziheng¹^ORCID,Niknia Farzad¹^ORCID,Liu Shanshan²^ORCID,Reviriego Pedro³^ORCID,Montuschi Paolo⁴^ORCID,Lombardi Fabrizio¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Northeastern University, Boston, MA, USA

2. Klipsch School of Electrical and Computer Engineering, New Mexico State University, Las Cruces, NM, USA

3. Departamento de Ingeniería Telemática, Universidad Carlos III de Madrid, Madrid, Spain

4. Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy

Funder

Spanish Agencia Estatal de Investigación

Department of Research and Innovation of Madrid Regional Authority

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

https://ieeexplore.ieee.org/ielam/12/10065566/9808395-aam.pdf

Reference45 articles.

1. Complete and partial fault tolerance of feedforward neural nets

2. Enabling Highly Efficient Capsule Networks Processing Through Software-Hardware Co-Design

3. Robustness of neural networks against storage media errors;qin,2017

4. Automatic Compiler Based FPGA Accelerator for CNN Training

5. Siamese multi-layer perceptrons for dimensionality reduction and face identification

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. LogSay: An Efficient Comprehension System for Log Numerical Reasoning;IEEE Transactions on Computers;2024-07

2. Emerging Machine Learning Using Siamese and Triplet Neural Networks;Design and Applications of Emerging Computer Systems;2024

3. Nanoscale Accelerators for Artificial Neural Networks;IEEE Nanotechnology Magazine;2022-12

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