EaD: ECC-Assisted Deduplication With High Performance and Low Memory Overhead for Ultra-Low Latency Flash Storage-Reference-Cited by-同舟云学术

EaD: ECC-Assisted Deduplication With High Performance and Low Memory Overhead for Ultra-Low Latency Flash Storage

Author:

Wu Suzhen¹^ORCID,Du Chunfeng¹,Zhu Weidong¹,Zhou Jindong¹,Jiang Hong²^ORCID,Mao Bo¹^ORCID,Zeng Lingfang³

Affiliation:

1. School of Informatics, Xiamen University, Xiamen, Fujian, China

2. Computer Science and Engineering Department, University of Texas at Arlington, Arlington, TX, USA

3. ZJ Lab-Enflame Joint Innovation Research Center, Zhejiang Lab, Hangzhou, China

Funder

Open Research Projects of Zhejiang Lab

Open Project Program of Wuhan National Laboratory for Optoelectronics

CCF-Alibaba Innovative Research Fund For Young Scholars

National Science Foundation

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software

Link

Reference45 articles.

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3. SiLo: A similarity-locality based near-exact deduplication scheme with low RAM overhead and high throughput;xia;Proc USENIX Annu Tech Conf,2011

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