High performance lithographic hotspot detection using hierarchically refined machine learning-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

High performance lithographic hotspot detection using hierarchically refined machine learning

Published:2011-01 Issue: Volume: Page:
ISSN:
Container-title:16th Asia and South Pacific Design Automation Conference (ASP-DAC 2011)
language:
Short-container-title:

Author:

Ding Duo,Torres Andres J.,Pikus Fedor G.,Pan David Z.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5716646/5722157/05722294.pdf?arnumber=5722294

Cited by 48 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Edge Pair-Based Layout Pattern Matching using Space-filling Curve;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10

2. Methodology for Lithography Hotspot Detection using ResNet50V2 and Model soups;2024 International Conference on Electronics, Information, and Communication (ICEIC);2024-01-28

3. A General Layout Pattern Clustering Using Geometric Matching-based Clip Relocation and Lower-bound Aided Optimization;ACM Transactions on Design Automation of Electronic Systems;2023-10-16

4. Geometrical positioning surveying-based features for BEOL line-end-pull-back modeling using regression-based machine-learning;Journal of Micro/Nanopatterning, Materials, and Metrology;2023-06-29

5. Machine Learning–Based VLSI Test and Verification;Machine Learning for VLSI Chip Design;2023-06-23

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP