A closed-form stability model for cross-coupled inverters operating in sub-threshold voltage region-Reference-Cited by-同舟云学术

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A closed-form stability model for cross-coupled inverters operating in sub-threshold voltage region

Published:2016-01 Issue: Volume: Page:
ISSN:
Container-title:2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC)
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Author:

Kamakari Tatsuya,Shiomi Jun,Ishihara Tohru,Onodera Hidetoshi

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7422345/7427971/7428092.pdf?arnumber=7428092

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Area-efficient fully digital memory using minimum height standard cells for near-threshold voltage computing;Integration;2019-03

2. Physical modeling of bitcell stability in subthreshold SRAMs for leakage-area optimization under PVT variations;Proceedings of the International Conference on Computer-Aided Design;2018-11-05

3. Analytical Stability Modeling for CMOS Latches in Low Voltage Operation;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2016

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