Author:
Deng Liang,Wong Martin D. F.,Chao Kai-Yuan,Xiang Hua
Cited by
2 articles.
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1. Robustify ML-Based Lithography Hotspot Detectors;Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design;2022-10-30
2. EUV and e-beam manufacturability;Proceedings of the 52nd Annual Design Automation Conference;2015-06-07